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Performance Testing

determines degree of ability.

See Also: Conformance, Qualification, Benchmark, Failure Analysis


Showing results: 721 - 735 of 1030 items found.

  • Installation Safety Testers

    VDE 0100 - PeakTech Prüf- und Messtechnik GmbH

    This innovative combination measuring device for testing electrical installations according to official laws convinces with its technical performance data in the high-end area. All important safety tests such as FI, voltage, loop, low-resistance, earth resistance and insulation tests for e-checks and new installations can be carried out safely by the electrician via the large 3.5“ TFT color display. Of course, the device comes with an extensive range of accessories, such as all necessary test leads, adapters, rods and the required software CD for the PC. The device can be charged with a power adapter or via a car adapter. During the daily use, this high-quality device is protected against dust and all-round water jets by its protection class IP 65.

  • Clock Drivers

    Pulse Instruments

    Multiple timing signals ("clocks") are required by CCDs, IR FPAs, and some CMOS image sensors to transport electrical charge across the array to a sense amplifier for conversion into image data. Pulse Instruments offers a line of "clock drivers" for generating these timing signals. The parameters of these clocks (clock rate, pulse width, pulse amplitude, rise- and fall-times, etc.) greatly influence the behavior and performance of the imaging device. Our products take logic-level inputs from a pattern generator and allow the user to adjust the output parameters to suit their device and testing requirements. Clocks can be "tweaked" in real-time to determine optimal operating parameters for a particular device, or else programmed in accordance with a test plan for automated production test.

  • High Low Temperature Test Chamber

    ACMAS Technologies Pvt. Ltd.

    The high low temperature test chambers from Weiber are climatic test chambers, designed to simulate highly precise high and low temperature environments for the testing of electrical and electronics items, metallic products, automobile parts, food items, biological samples, chemicals, building materials and other wide variety of processed and packaged goods. These test chambers find widespread usage in manufacturing units, quality control units and scientific research organizations and are commonly employed for heat endurance test, cold endurance test and humidity and dryness endurance tests of products. These tests help in determining the product performance in specific environments and also help in identifying any manufacturing flaws and in determining its stability and shelf life.

  • Network Test Solution

    CyPerf - Keysight Technologies

    Realism: Create digital twin of users, applications, and attacks to replicate and test QoE in real-world network environments.Native authentication: Send application and security traffic over authenticated sessions at high scale.Highly scalable: Supports millions of concurrent users and millions of connections per second that elastically scale up and down, enabling both resiliency and chaos testing.Containerized agents: Deploy lightweight traffic agents as containerized pods on-prem, VMs, managed Kubernetes deployments, private or public cloud (AWS, GCP, Azure)Lab and live network testing: Test performance and security both pre-deployment in a lab or safely in live production networks.Flexible: Portable subscription-based software solution with a robust and intuitive cloud-native GUI management dashboard

  • Electric Vehicle Test Solution

    Chroma ATE Inc.

    As the automotive industry advances power conversion and battery technologies, Chroma has been actively working to improve electric vehicle (EV) testing performance and cost by developing flexible automated power conversion test platforms and regenerative battery test systems. Chroma ATE is a world leading manufacturer of precision test and measurement instrumentation, automated test systems, intelligent manufacturing systems, and turnkey test and automation solutions. Chroma’s Automated Test Systems for Electric and Hybrid Electric Vehicles consist of standard test platforms that are combined into one expandable test system that can test most power components in an EV’s power system. Compared to specialized test equipment developed for a single EV model or application, Chroma’s systems provide greater flexibility.

  • Diagnostic Set

    OMK-SR-OTS.2 - OPTOKON a.s.

    Diagnostic set includes measuring instruments and tools for diagnosing faults on fiber optic cables with connectors STRATOS and CTOS, and direct technical successors connectors HMA. The OPTOKON Diagnostic Set includes two instruments - Light source and Power meter. Both instruments are housed in a hard carry case that meets the requirement of fiber optic networks installation and maintenance teams, who require rugged and lightweight fiber optic test equipment that combines high performance with ease of use and reliable operation. The Diagnostic Set allows traceable measurements on dual wavelength and data storage to the PC. It includes the hybrid master HMA-FC patchcord for testing of harsh environmental networks and is comprised of these measurement instruments: LS-800 light source and PM-800 power meter

  • High Voltage Switching Test System

    Accel-RF Corporation

    The advanced development of new technologies, such as SiC and GaN, have opened the opportunity for more efficient and higher voltage/power performance in switching and power management circuits. Their high cutoff frequencies, low on-state resistance, and very high breakdown voltages can increase power supply power handling densities approaching hundreds of watts/inch. Reliability of these new technologies and techniques is critical for realizing practical applications. While Silicon devices have a rich history of proven reliability, these newer compound semiconductor technologies are too new to have a reliability history and have not been well proven. Further, process variations, even in well-controlled lines, yield widely varying results. This has driven the need for additional testing and to burn-in devices prior to delivery.

  • Rubber Testing Equipment

    Dongguan Amade Instruments Technology Co., Ltd

    Rubber testing equipment are used to test the physical properties, chemical properties, thermal properties of uncompounded and compounded rubbers at prescribed conditions to help manufactures or researchers in comprehending the characteristics, updating the formula and improving product quality. Including volatile component, ash content, Mooney viscosity, vulcanization curve, Mooney scorch time, hardness, tensile properties, tearing, the compression performance, impact, friction resistance, fatigue resistance, peel strength, vertical & horizontal combustion, smoke density, limiting oxygen index, the flame spread rate, the surface resistance, surface resistivity, volume resistivity, the breakdown voltage, dielectric strength, dielectric loss, antistatic properties, Aging test (UV, Xenon lamp, carbon arc lamp, ozone) etc.

  • Battery Voltage Supervisor

    BVS - IBEKO Power AB

    DV Power battery voltage supervisor – BVS, is an accurate battery voltage monitoring system that monitors the state of health of battery systems. It records important battery parameters such as battery voltage, inter-cell connection voltage, and ambient temperature. Because of that, it can be a support tool for capacity testing.The BVS voltage supervisor is an integrated system consisting of:BVS Control Unit (BVS-CU)Cell Voltage Modules (CVM)String Voltage Module (SVM) (optional)String Current Module (SCM) (optional)It is an ideal testing tool for maintenance, troubleshooting and performance tests on individual stationary batteries and battery packs in critical backup energy solutions.BVS-CU provides ambient temperature measurements on multiple locations (4 temperature channels). Overall string voltage and string current monitoring can be achieved by using an optional string voltage module (SVM) and string current module (SCM).There are two types of DV Power battery voltage supervisors:BVS – One cell voltage module measures 1 cellBVS-4 – One cell voltage module measures 4 cellsCVM modules detect cells that fail a discharge test based on monitored voltage values. As a result of that, these cells can be safely removed from the battery string.Data acquisition and analysis of data collected from the modules are available in the DV-B Win application software suite. They provide data viewing, tracking, and generation of comprehensive reports.

  • Test Solution

    Eye-BERT MicroX - Spectronix

    The Eye-BERT MicroX is a compact, easy to use test solution offering high performance bit error rate testing at a fraction of the cost of competing solutions.  The unit is offered in two speed grades including the X10 which operates up to 14.5Gbps, and the X30 which extends the data rate to 29Gbps.  Its broad data rate capabilities and long test patterns make this unit suitable for testing nearly all optical SFP, SFP+, and SFP28 transceivers in production with just one unit. The real-time eye opening monitor and eye scanning capability can aid in troubleshooting by providing the operator with additional link quality information.  Other features include Autonomous pattern detection, SFP diagnostic tools, and wavelength tuning (per transceiver capability).  With a click of a button the Eye-BERT MicroX will automatically test an SFP module based on its advertised capabilities and generate a detailed test report complete with manufacturer, part number, serial number, date code, fiber type, link length, speed, and test results.  The Unit is supplied with anti-skid bumpers and is small enough to be integrated into larger systems for dedicated link verification.

  • Wide-range High-power DC Power Supply

    IT6500 Series - I-TECH Electronic Co., Ltd

    With ITECH’s latest technology, the IT6500 series offers a full-featured high-performance power test solution. With fast response these DC power supplies provide users with a new level of power supply performance. From 800W to 30 kW, the whole series include more than 100 models. The maximum output voltage and current is up to 1000V and 1200A respectively. With its autoranging capabillity, it also has a super wide range of voltage and current applications. Users can choose the power supply that fits their testing requirements perfectly. In combination with the IT-E501 power dissipater unit, the current sinking capacity of IT6500C can be 100%, 200%, 300% and the power sinking up to 300% of the Sourcing capability. As a high-speed two-quadrant power supply, IT6500C (1800W-30kW) series has a priority function so as to realize high-speed current transition between power supply mode and electronic load mode, to achieve fast switching between sourcing and sinking current, even can achieve seamless switching under certain conditions. IT6512, IT6513 and IT6500C series power supplies provide built-in DIN40839 and ISO-16750-2 testing curves, support solar panel I-V curve simulation function.

  • Energy Dispersive X-ray Fluorescence Analyzer

    X-5000 - HORIBA, Ltd.

    HORIBA continues it's innovation in the petroleum market by proudly teaming with Olympus Innov-X to promote the X-5000 Mobile XRF Analyzer. The X-5000 is a rugged, fully integrated closed beam portable EDXRF system that offers the power and performance of a traditional benchtop XRF, but is designed for transportable operation. Using a Silicone Drift Detector, low PPM detection limits can be achieved for many elements in a variety of sample types and matrices. Applications include fuels, additives, and wear metal oils to crude oils, water, coke, and coal allow this easy to use analyzer to be a fast, flexible solution to traditional testing methods.Detectable elements to concentrations of 100% are: Aluminum, Antimony, Barium, Cadmium, Calcium, Chlorine, Chromium, Copper, Iron, Manganese, Molybdenum, Nickel, Phosphorous, Potassium, Silicon, Silver, Sulfur, Tin, Titanium, Vanadium, and Zinc.

  • SFP Based Fiber Optic Test Solution

    Eye-BERT Micro - Spectronix

    The Eye-BERT Micro is a low cost, easy to use, all-in-one SFP based fiber optic test solution offering high performance bit error rate testing at a fraction of the cost while providing a rich set of features not found in other bit error rate testers. Features include: variable bit rate, user programmable patterns, and optical power and temperature monitoring (per SFP capability). Additionally, with a click of a button, the Eye-BERT Micro will automatically test an SFP module based on the information it reads from the module and generate a detailed test report complete with manufacturer, part number, serial number, date code, fiber type, link length, speed, and test results. The Unit is supplied with anti-skid bumpers and is small enough to be integrated into larger systems for dedicated link verification.

  • Multi-channel DC Electronic Load

    IT8700 Series - I-TECH Electronic Co., Ltd

    IT8700 series programmable DC electronic load adopts removable modules design, supports up to 16 channels with mainframe extension transient mode up to 25 kHz, which improves your test efficiency, with high resolution and accuracy. Users can freely choose in the 8 load modules according to the number of channels and power requirements, controlled by mainframe control panel, or controlled by host computer software via built-in LAN / RS232 /USB / GPIB interface. IT8700 is with adjustable slope, list function, automatic test and other functions, and can be applied to multiple or single output AC/ DC, DC / DC power converters, chargers and other power supply electronic components performance test, also can be used in ATE test system, solar cells, LED, communications testing, aerospace and other fields.

  • Dynamic Digital I/O With Per Channel Timing, Programmable Logic Levels And PMU PXI Card

    GX5296 - Marvin Test Solutions, Inc.

    The GX5296 offers advanced dynamic digital I/O performance and capabilities in a single slot, 3U PXI format. The 32-channel, GX5296 features timing per pin, multiple time sets, data formatting, and an advanced sequencer – providing users with the capability to emulate and test complex digital busses for system, board or device test applications. Offering sub-nanosecond edge placement resolution per pin and a PMU per pin, the GX5296 has the ability to perform both DC and AC parametric testing. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).

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